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Journal description
All volumes of the corresponding journal
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Details for article 24 of 24 found articles
| Title: |
Total ionizing dose hardness analysis of transistors in commercial 180 nm CMOS technology |
| Author: |
Kumar, Mukesh Ubhi, Jagpal Singh Basra, Sanjeev Chawla, Anuj Jatana, H.S. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 115 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 24 of 24 found articles
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