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Journal description
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Details for article 1 of 24 found articles
| Title: |
A critical evaluation based on Lattice Boltzmann method of nanoscale thermal behavior inside MOSFET and SOI-MOSFET |
| Author: |
Zobiri, Oussama Atia, Abdelmalek Arıcı, Müslüm |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 115 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 24 found articles
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