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Journal description
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Details for article 46 of 49 found articles
| Title: |
Noise behavior of vertical tunnel FETs under the influence of interface trap states |
| Author: |
Wangkheirakpam, Vandana Devi Bhowmick, Brinda Pukhrambam, Puspa Devi |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 114 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 46 of 49 found articles
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