|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 28 of 49 found articles
| Title: |
Dielectric surface roughness scattering induced crosstalk performance of coupled MCB interconnects |
| Author: |
Sharma, Manvi Rai, Mayank Kumar Khanna, Rajesh |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 114 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 28 of 49 found articles
| << previous | next >> |