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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
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Details for article 39 of 55 found articles
| Title: |
Measurement of minority carrier lifetime and diffusion length in silicon epitaxial layers by means of the photocurrent technique |
| Author: | |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 11 () nr. 5 pages 42 |
| Year: |
1980 |
| Contents: | |
| Publisher: |
Mackintosh Publications Ltd., Luton |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 39 of 55 found articles
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