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Journal description
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Details for article 2 of 48 found articles
| Title: |
A channel conductance measuring technique for determining the interface properties of a SiO-InSb thin film transistor |
| Author: | |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 10 () nr. 4 pages 38 |
| Year: |
1979 |
| Contents: | |
| Publisher: |
Mackintosh Publications Ltd., Luton |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 48 found articles
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