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Journal description
All volumes of the corresponding journal
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Details for article 45 of 75 found articles
| Title: |
On the new procedure for the determination of surface conditions in thin films with internal layer inhomogeneity |
| Author: | |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 10 () nr. 1 pages 66 |
| Year: |
1979 |
| Contents: | |
| Publisher: |
Mackintosh Publications Ltd., Luton |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 45 of 75 found articles
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