|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 31 of 35 found articles
| Title: |
Thermal transient measurement of insulated gate devices using the thermal properties of the channel resistance and parasitic elements |
| Author: |
Farkas, Gabor Simon, Gergely |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 46 (2015) nr. 12PA pages 10 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 31 of 35 found articles
| << previous | next >> |