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Journal description
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Details for article 5 of 17 found articles
| Title: |
A guided Bayesian inference approach for detection of multiple flaws in structures using the extended finite element method |
| Author: |
Yan, Gang Sun, Hao Waisman, Haim |
| Appeared in: |
Computers and structures |
| Paging: | Volume 152 (2015) nr. C pages 18 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 17 found articles
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