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                                       Details for article 25 of 25 found articles
 
 
  Ultra-sensitive shape sensor test structures based on piezoresistive doped nanocrystalline silicon
 
 
Title: Ultra-sensitive shape sensor test structures based on piezoresistive doped nanocrystalline silicon
Author: Alpuim, P.
Marins, E.S.
Rocha, P.F.
Trindade, I.G.
Carvalho, M.A.
Lanceros-Mendez, S.
Appeared in: Vacuum
Paging: Volume 83 (2009) nr. 10 pages 4 p.
Year: 2009
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 25 of 25 found articles
 
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