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Journal description
All volumes of the corresponding journal
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All articles of the corresponding issues
Details for article 14 of 102 found articles
| Title: |
Complementarity of X-ray diffraction and RBS in thin film characterization |
| Author: |
Machajdík, Daniel Kobzev, Alexander Pavlovich Fröhlich, Karol |
| Appeared in: |
Vacuum |
| Paging: | Volume 78 (2005) nr. 2-4 pages 7 p. |
| Year: |
2005 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 102 found articles
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