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Journal description
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Details for article 3 of 26 found articles
| Title: |
Depth profile analysis of porous Si film by ERDA using a ΔE — E detector telescope |
| Author: |
Avasthi, DK Hui, SK Subramaniyam, ET Mehta, BR |
| Appeared in: |
Vacuum |
| Paging: | Volume 47 (1996) nr. 9 pages 4 p. |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 26 found articles
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