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                                       Details for article 22 of 24 found articles
 
 
  Study on the hydrogen depth profiles in amorphous silicon films by elastic recoil detection
 
 
Title: Study on the hydrogen depth profiles in amorphous silicon films by elastic recoil detection
Author: Changgeng, Liao
Yongqiang, Wang
Shengsheng, Yang
Hui, Jiang
Zhihao, Zheng
Appeared in: Vacuum
Paging: Volume 44 (1993) nr. 11-12 pages 4 p.
Year: 1993
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 22 of 24 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands