|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 87 of 241 found articles
| Title: |
In situ infrared ellipsometry study of the vibrational properties, and the growth of amorphous semiconductor ultrathin films |
| Author: |
Blayo, N Drévillon, B Huc, J |
| Appeared in: |
Vacuum |
| Paging: | Volume 41 (1990) nr. 4-6 pages 4 p. |
| Year: |
1990 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 87 of 241 found articles
| << previous | next >> |