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                                       Details for article 47 of 80 found articles
 
 
  On the oxide interface micro-roughness in MOS devices
 
 
Title: On the oxide interface micro-roughness in MOS devices
Author: Placencia, I
Suñé, J
Farrés, E
Barniol, N
Aymerich, X
Appeared in: Vacuum
Paging: Volume 39 (1989) nr. 7-8 pages 4 p.
Year: 1989
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 47 of 80 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands