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                                       Details for article 3 of 7 found articles
 
 
  Interface characteristics of InP/Si heterojunction fabricated by low-temperature wafer bonding based on microcrystalline Ge interlayer
 
 
Title: Interface characteristics of InP/Si heterojunction fabricated by low-temperature wafer bonding based on microcrystalline Ge interlayer
Author: Wang, Jie
Ke, Shaoying
Li, Jiahui
Meng, WenHao
Huang, Zhiwei
Zhou, Jinrong
Liu, Guanzhou
Wang, Chong
Qi, Dongfeng
Appeared in: Vacuum
Paging: Volume 223 () nr. C pages p.
Year: 2024
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 7 found articles
 
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