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                                       Details for article 8 of 84 found articles
 
 
  An ion beam spot size monitor based on a nano-machined Si photodiode probed by means of the ion beam induced charge technique
 
 
Title: An ion beam spot size monitor based on a nano-machined Si photodiode probed by means of the ion beam induced charge technique
Author: Andrini, G.
Nieto Hernández, E.
Provatas, G.
Brajkovic, M.
Crnjac, A.
Tchernij, S. Ditalia
Forneris, J.
Rigato, V.
Campostrini, M.
Siketic, Z.
Jaksic, M.
Vittone, E.
Appeared in: Vacuum
Paging: Volume 205 () nr. C pages p.
Year: 2022
Contents:
Publisher: The Authors
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 8 of 84 found articles
 
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