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                                       Details for article 22 of 52 found articles
 
 
  Hydrogen microwave plasma etching of silicon dioxide at high temperatures with in situ low-coherence interferometry control
 
 
Title: Hydrogen microwave plasma etching of silicon dioxide at high temperatures with in situ low-coherence interferometry control
Author: Yurov, V. Yu
Bolshakov, A.P.
Altakhov, A.S.
Fedorova, I.A.
Zavedeev, E.V.
Popovich, A.F.
Ralchenko, V.G.
Appeared in: Vacuum
Paging: Volume 199 () nr. C pages p.
Year: 2022
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 22 of 52 found articles
 
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