Corrigendum to “Compositional analysis by RBS, XPS and EDX of ZnO:Al,Bi and ZnO:Ga,Bi thin films deposited by d.c. magnetron sputtering” [Vacuum 161 (2019) 268–275]
Titel:
Corrigendum to “Compositional analysis by RBS, XPS and EDX of ZnO:Al,Bi and ZnO:Ga,Bi thin films deposited by d.c. magnetron sputtering” [Vacuum 161 (2019) 268–275]
Auteur:
Ribeiro, J.M. Correia, F.C. Salvador, P.B. Rebouta, L. Alves, L.C. Alves, E. Barradas, N.P. Mendes, A. Tavares, C.J.