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Compositional analysis by RBS, XPS and EDX of ZnO:Al,Bi and ZnO:Ga,Bi thin films deposited by d.c. magnetron sputtering |
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Titel: |
Compositional analysis by RBS, XPS and EDX of ZnO:Al,Bi and ZnO:Ga,Bi thin films deposited by d.c. magnetron sputtering |
Auteur: |
Ribeiro, J.M. Correia, F.C. Salvador, P.B. Rebouta, L. Alves, L.C. Alves, E. Barradas, N.P. Mendes, A. Tavares, C.J. |
Verschenen in: |
Vacuum |
Paginering: |
Jaargang 161 (2019) nr. C pagina's 268-275 |
Jaar: |
2019 |
Inhoud: |
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Uitgever: |
Elsevier Ltd |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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