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                                       Details for article 6 of 64 found articles
 
 
  Comparison of plasma properties in normal and multiple holes hollow cathode RF PECVD and their utility in a-SiNx:H thin film deposition
 
 
Title: Comparison of plasma properties in normal and multiple holes hollow cathode RF PECVD and their utility in a-SiNx:H thin film deposition
Author: Sahu, B.B.
Kim, Seok H.
Lee, J.S.
Han, Jeon G.
Appeared in: Vacuum
Paging: Volume 160 (2019) nr. C pages 316-324
Year: 2019
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 6 of 64 found articles
 
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