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                                       Details for article 16 of 75 found articles
 
 
  Deep metric learning for few-shot image classification: A Review of recent developments
 
 
Title: Deep metric learning for few-shot image classification: A Review of recent developments
Author: Li, Xiaoxu
Yang, Xiaochen
Ma, Zhanyu
Xue, Jing-Hao
Appeared in: Pattern recognition
Paging: Volume 138 () nr. C pages p.
Year: 2023
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 16 of 75 found articles
 
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