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Journal description
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Details for article 11 of 16 found articles
| Title: |
Stacking faults in silicon carbide (6H) as observed by means of transmission electron microscopy |
| Author: |
Van Landuyt, J. Amelinckx, S. |
| Appeared in: |
Materials research bulletin |
| Paging: | Volume 6 (1971) nr. 7 pages 7 p. |
| Year: |
1971 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 16 found articles
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