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Journal description
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Details for article 15 of 22 found articles
| Title: |
New perspectives in defect centric model for NBTI reliability |
| Author: |
Nouguier, D. Ghibaudo, G. Federspiel, X. Rafik, M. Roy, D. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 98 (2019) nr. C pages 119-123 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 22 found articles
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