|
| << previous |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 12 of 12 found articles
| Title: |
Simulation of substrate contact effects on heavy ion-induced current transient in SiGe HBT |
| Author: |
Wei, Jia-nan He, Chao-hui Li, Pei Li, Yong-hong Guo, Hong-xia |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 95 (2019) nr. C pages 28-35 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 12 found articles
| << previous |