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Journal description
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Details for article 8 of 17 found articles
| Title: |
Cycle life and statistical predictive reliability model for all-solid-state thin film microbatteries |
| Author: |
Grillon, Nathanaël Bouyssou, Émilien Jacques, Sébastien Gautier, Gaël |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 93 (2019) nr. C pages 102-108 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 17 found articles
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