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Journal description
All volumes of the corresponding journal
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Details for article 6 of 17 found articles
| Title: |
Characteristics and reliability of VDMOS under capacitive loads |
| Author: |
Zhang, Yulong Wang, Lulu Gong, Xueqin Gao, Bo Wang, Lixin Luo, Jiajun |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 93 (2019) nr. C pages 8-15 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 17 found articles
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