|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 5 of 17 found articles
| Title: |
A voltage-transient method for characterizing traps in GaN HEMTs |
| Author: |
Zheng, Xiang Feng, Shiwei Gao, Yifu Zhang, Yamin Jia, Yunpeng Pan, Shijie |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 93 (2019) nr. C pages 57-60 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 17 found articles
| << previous | next >> |