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Journal description
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Details for article 20 of 23 found articles
| Title: |
The influence of microwave pulse width on the thermal burnout effect of an LNA constructed by a GaAs PHEMT |
| Author: |
Yi, Shipeng Du, Zhengwei |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 85 (2018) nr. C pages 140-147 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 23 found articles
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