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Journal description
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Details for article 25 of 32 found articles
| Title: |
Reliability comparison of 28 V–50 V GaN-on-SiC S-band and X-band technologies |
| Author: |
Gajewski, Donald A. Ganguly, Satyaki Sheppard, Scott Wood, Simon Barner, Jeff B. Milligan, Jim Palmour, John |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 84 (2018) nr. C pages 1-6 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 25 of 32 found articles
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