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Journal description
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Details for article 2 of 32 found articles
| Title: |
A double snapback SCR ESD protection scheme for 28 nm CMOS process |
| Author: |
Hu, Tao Dong, Shurong Jin, Hao Wong, Hei Xu, Zekun Li, Xiang Liou, Juin J. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 84 (2018) nr. C pages 20-25 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 32 found articles
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