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Journal description
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Details for article 18 of 32 found articles
| Title: |
Investigation of enhanced low dose rate sensitivity in SiGe HBTs by 60Co γ irradiation under different biases |
| Author: |
Zhang, Jin-xin Guo, Qi Guo, Hong-Xia Lu, Wu He, Chao-hui Wang, Xin Li, Pei Wen, Lin |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 84 (2018) nr. C pages 105-111 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 32 found articles
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