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                                       Details for article 23 of 30 found articles
 
 
  Study of the operation and SET robustness of a CMOS pulse stretching circuit
 
 
Title: Study of the operation and SET robustness of a CMOS pulse stretching circuit
Author: Andjelkovic, Marko
Krstic, Milos
Kraemer, Rolf
Appeared in: Microelectronics reliability
Paging: Volume 82 (2018) nr. C pages 100-112
Year: 2018
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 23 of 30 found articles
 
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