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Journal description
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Details for article 41 of 46 found articles
| Title: |
Temperature-dependent hole transport for pentacene thin-film transistors with a SiO2 gate dielectric modified by (NH4)2S x treatment |
| Author: |
Lin, Yow-Jon Hung, Cheng-Chun |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 81 (2018) nr. C pages 90-94 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 41 of 46 found articles
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