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Journal description
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Details for article 36 of 46 found articles
| Title: |
Recovery behaviors in n-channel LTPS-TFTs under DC stress |
| Author: |
Yan, Wei Yu, Zhinong Guo, Jian Shi, Dawei Xue, Jianshe Xue, Wei |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 81 (2018) nr. C pages 117-120 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 36 of 46 found articles
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