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Journal description
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Details for article 26 of 46 found articles
| Title: |
Investigation on NBTI-induced dynamic variability in nanoscale CMOS devices: Modeling, experimental evidence, and impact on circuits |
| Author: |
Guo, Shaofeng Wang, Runsheng Ren, Pengpeng Liu, Changze Luo, Mulong Jiang, Xiaobo Wang, Yangyuan Huang, Ru |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 81 (2018) nr. C pages 101-111 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 26 of 46 found articles
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