A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability
Titel:
A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability
Auteur:
Kaczer, B. Franco, J. Weckx, P. Roussel, Ph.J. Putcha, V. Bury, E. Simicic, M. Chasin, A. Linten, D. Parvais, B. Catthoor, F. Rzepa, G. Waltl, M. Grasser, T.