Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 27 of 39 found articles
 
 
  Modulation method for measuring thermal impedance components of semiconductor devices
 
 
Title: Modulation method for measuring thermal impedance components of semiconductor devices
Author: Smirnov, V.I.
Sergeev, V.A.
Gavrikov, A.A.
Shorin, A.M.
Appeared in: Microelectronics reliability
Paging: Volume 80 (2018) nr. C pages 205-212
Year: 2018
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 27 of 39 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands