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Journal description
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Details for article 15 of 39 found articles
| Title: |
Empirical derivation of upper and lower bounds of NBTI aging for embedded cores |
| Author: |
Chen, Yukai Macii, Enrico Poncino, Massimo |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 80 (2018) nr. C pages 294-305 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 39 found articles
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