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Journal description
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Details for article 12 of 26 found articles
| Title: |
Improving the ESD self-protection capability of 60V HV p-channel LDMOS large array device in 0.25μm BCD process |
| Author: |
Chen, Hung-Wei Chang, Mi-Chang |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 74 (2017) nr. C pages 8 p. |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 26 found articles
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