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Journal description
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Details for article 7 of 16 found articles
| Title: |
Effective work-function control technique applicable to p-type FinFET high-k/metal gate devices |
| Author: |
Yamaguchi, Shimpei Bayindir, Zeynel He, Xiaoli Uppal, Suresh Srinivasan, Purushothaman Yong, Chloe Choi, Dongil Joshi, Manoj Yang, Hyuck Soo Hu, Owen Samavedam, Srikanth Sohn, D.K. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 72 (2017) nr. C pages 5 p. |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 16 found articles
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