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Journal description
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Details for article 2 of 16 found articles
| Title: |
A new erase method for scaled NAND flash memory device |
| Author: |
Lin, Chan-Ching Chang-Liao, Kuei-Shu Huang, Tzung-Bin Yu, Cheng-Jung Ko, Hsueh-Chao |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 72 (2017) nr. C pages 5 p. |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 16 found articles
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