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Journal description
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Details for article 24 of 24 found articles
| Title: |
X-ray inspection of TSV defects with self-organizing map network and Otsu algorithm |
| Author: |
Shen, Junjie Chen, Pengfei Su, Lei Shi, Tielin Tang, Zirong Liao, Guanglan |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 67 (2016) nr. C pages 129-134 |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 24 of 24 found articles
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