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Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs |
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Title: |
Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs |
Author: |
Zhang, Wenqi Wang, Tzuo-Li Huang, Yan-Hua Cheng, Tsu-Ting Chen, Shih-Yao Li, Yi-Ying Hsu, Chun-Hsiang Lai, Chih-Jui Yeh, Wen-Kuan Yang, Yi-Lin |
Appeared in: |
Microelectronics reliability |
Paging: |
Volume 67 (2016) nr. C pages 89-93 |
Year: |
2016 |
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Publisher: |
Elsevier Ltd |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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