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                                       Details for article 14 of 24 found articles
 
 
  Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs
 
 
Title: Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs
Author: Zhang, Wenqi
Wang, Tzuo-Li
Huang, Yan-Hua
Cheng, Tsu-Ting
Chen, Shih-Yao
Li, Yi-Ying
Hsu, Chun-Hsiang
Lai, Chih-Jui
Yeh, Wen-Kuan
Yang, Yi-Lin
Appeared in: Microelectronics reliability
Paging: Volume 67 (2016) nr. C pages 89-93
Year: 2016
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 14 of 24 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands