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Journal description
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Details for article 9 of 136 found articles
| Title: |
A process-variation-resilient methodology of circuit design by using asymmetrical forward body bias in 28nm FDSOI |
| Author: |
Wang, Y. Cai, H. Naviner, L.A.B. Zhao, X.X. Zhang, Y. Slimani, M. Klein, J.O. Zhao, W.S. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 64 (2016) nr. C pages 5 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 136 found articles
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