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Journal description
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Details for article 33 of 136 found articles
| Title: |
Detection and analysis of stress-induced voiding in Al-power lines by acoustic GHz-microscopy |
| Author: |
Brand, S. Simon-Najasek, M. Kögel, M. Jatzkowski, J. Portius, R. Altmann, F. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 64 (2016) nr. C pages 5 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 33 of 136 found articles
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