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                                       Details for article 134 of 136 found articles
 
 
  Transient thermal analysis for accelerated reliability testing of LEDs
 
 
Title: Transient thermal analysis for accelerated reliability testing of LEDs
Author: Elger, G.
Müller, D.
Hanß, A.
Schmid, M.
Liu, E.
Karbowski, U.
Derix, R.
Appeared in: Microelectronics reliability
Paging: Volume 64 (2016) nr. C pages 5 p.
Year: 2016
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 134 of 136 found articles
 
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