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Journal description
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Details for article 108 of 136 found articles
| Title: |
Potentiality of healing techniques in hot-carrier damaged 28nm FDSOI CMOS nodes |
| Author: |
Bravaix, A. Cacho, F. Federspiel, X. Ndiaye, C. Mhira, S. Huard, V. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 64 (2016) nr. C pages 5 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 108 of 136 found articles
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