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Journal description
All volumes of the corresponding journal
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All articles of the corresponding issues
Details for article 105 of 136 found articles
| Title: |
Performance vs. reliability adaptive body bias scheme in 28nm & 14nm UTBB FDSOI nodes |
| Author: |
Ndiaye, C. Huard, V. Federspiel, X. Cacho, F. Bravaix, A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 64 (2016) nr. C pages 5 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 105 of 136 found articles
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