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                                       Details for article 15 of 46 found articles
 
 
  Evaluation of SiC MOSFET power modules under unclamped inductive switching test environment
 
 
Title: Evaluation of SiC MOSFET power modules under unclamped inductive switching test environment
Author: Nawaz, Muhammad
Appeared in: Microelectronics reliability
Paging: Volume 63 (2016) nr. C pages 7 p.
Year: 2016
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 15 of 46 found articles
 
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